The Coxem EM-40 SEM is an instrument capable of achieving levels of detail that are impossible to observe with natural light due to its ultra-high resolution. In addition, it incorporates integrated chemical analysis (EDS) to identify the elements that make up the samples.

  • It uses an electron beam instead of light to generate images, allowing the observation of textures, morphologies, microstructures, and enabling chemical analysis through Energy Dispersive Spectroscopy (EDS).
  • It produces very high-resolution images of the sample surface.
  • NanoStation 5.0 software.
  • SPT-20 Ion Coater for coating non-conductive samples.

Applications

  • Materials science.
  • Biology and medicine.
  • Geology.
  • Forensics.
  • Industrial quality control.